Synthesis and characterization of some carbon based nanostructures
Pages 84-94
V. Ciupina, I. Morjan, R. Alexandrescu, F. Dumitrache, G. Prodan, C. P. Lungu, R. Vladoiu, I. Mustata, V. Zarovschi, J. Sullivan, S. Saied, E. Vasile, I. M. Oancea-Stanescu, M. Prodan
Abstract. The aim of present paper is to present the latest results on investigations of the carbon thin film deposited by Thermionic Vacuum Arc (TVA) method and laser pyrolysis. X-ray photoelectron spectroscopy (XPS) and X-ray generated Auger electron spectroscopy (XAES) were used to determine composition and sp2 to sp3 ratios in the outer layers of the film surfaces. The analyses were conducted in a Thermoelectron ESCALAB 250 electron spectrometer equipped with a hemispherical sector energy analyser. Monochromated Al K X-radiation was employed for the XPS examination, at source excitation energy of 15 KeV and emission current of 20 mA. Analyzer pass energy of 20 eV with step size of 0.1 eV and dwell time of 100 ms was used throughout.